SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Measurement of high-departure aspheres using subaperture stitching with the Variable Optical Null (VON)
Kulawiec, Andrew, Murphy, Paul, DeMarco, Michael, Yang, Li, Namba, Yoshiharu, Walker, David D., Li, ShengyiVolume:
7655
Année:
2010
Langue:
english
DOI:
10.1117/12.864962
Fichier:
PDF, 374 KB
english, 2010
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