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[IEEE 2015 IEEE International Solid- State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2015.2.22-2015.2.26)] 2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers - 17.7 A digital DLL with hybrid DCC using 2-step duty error extraction and 180° phase aligner for 2.67Gb/S/pin 16Gb 4-H stack DDR4 SDRAM with TSVs
Yun, Won-Joo, Song, Indal, Jeoung, Hanki, Choi, Hundae, Lee, Seok-Ho, Kim, Jun-Bae, Kim, Chi-Wook, Choi, Jung-Hwan, Jang, Seong-Jin, Choi, Joo SunAnnée:
2015
Langue:
english
DOI:
10.1109/ISSCC.2015.7063056
Fichier:
PDF, 712 KB
english, 2015