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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Applications of Digital Image Processing XXXVI - On selecting reference image models for anomaly detection in industrial systems
Xiao, Xinhua, Quan, Jin, Ferro, Andrew, Han, Chia Y., Zhou, Xuefu, Wee, William G., Tescher, Andrew G.Volume:
8856
Année:
2013
Langue:
english
DOI:
10.1117/12.2023471
Fichier:
PDF, 366 KB
english, 2013