SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Spectroscopic ellipsometry studies on vacuum-evaporated zinc selenide thin film
Gao, Weidong, Zhang, Yudong, Wyant, James C., Smythe, Robert A., Wang, HexinVolume:
7283
Année:
2009
Langue:
english
DOI:
10.1117/12.828718
Fichier:
PDF, 323 KB
english, 2009
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