SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Novel method for misalignments measurement on imaging systems through quality image analysis
Oteo, Esther, Fernández-Dorado, José, Arasa, J., Blanco, P., Pizarro, C., Lehmann, Peter H., Osten, Wolfgang, Gastinger, KayVolume:
8082
Année:
2011
Langue:
english
DOI:
10.1117/12.889248
Fichier:
PDF, 501 KB
english, 2011
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