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X-Ray Diffraction Analysis of Residual Stresses in Alumina-Chromium Composites and Comparison with Numerical Simulations
Geandier, G., Weisbecker, Patrick, Denis, S., Hazotte, Alain, Mocellin, A., Lebrun, Jean Lu, Elkaim, E.Volume:
404-407
Année:
2002
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.404-407.547
Fichier:
PDF, 464 KB
2002