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SPIE Proceedings [SPIE Scanning Microscopy 2010 - Monterey, California (Monday 17 May 2010)] Scanning Microscopy 2010 - Physico-chemical characterization of engineered metal oxide nanoparticles: the critical role of microscopy
La Fontaine, A., Coleman, V. A., Jämting, A. K., Lawn, M., Herrmann, J., Miles, J. R., Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Joy, David C.Volume:
7729
Année:
2010
Langue:
english
DOI:
10.1117/12.853772
Fichier:
PDF, 2.84 MB
english, 2010