SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Oxide-based Materials and Devices IV - Defects study of MOCVD grown β-Ga 2 O 3 films
Ravadgar, Parvaneh, Horng, Ray-Hua, Tu, Li-Wei, Ou, Sin-Liang, Pan, Hui-Ping, Yao, Shu-De, Teherani, Ferechteh Hosseini, Look, David C., Rogers, David J.Volume:
8626
Année:
2013
Langue:
english
DOI:
10.1117/12.2002913
Fichier:
PDF, 1.94 MB
english, 2013
File converter
Plus de résultats de recherche
More benefits 
