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SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - Optimized design of a TOF laser range finder based on time-correlated single-photon counting
Han, Sen, Yoshizawa, Toru, Zhang, Song, Wang, Huanqin, Yang, Yixin, Huang, Zhe, Cao, YangYang, Gui, HuaqiaoVolume:
9276
Année:
2014
Langue:
english
DOI:
10.1117/12.2071405
Fichier:
PDF, 2.35 MB
english, 2014