SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Interferometry XII: Techniques and Analysis - Pixelated phase-mask dynamic interferometer
Millerd, James E., Brock, Neal J., Hayes, John B., North-Morris, Michael B., Novak, Matt, Wyant, James C., Creath, Katherine, Schmit, JoannaVolume:
5531
Année:
2004
Langue:
english
DOI:
10.1117/12.560807
Fichier:
PDF, 451 KB
english, 2004