SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Research of fluorescence lifetime imaging technology based on heterodyne method of frequency domain
Sheng, Cui-xia, Li, Tian-ze, Tang, He-jing, Zhang, Yudong, Sasián, José, Xiang, Libin, To, SandyVolume:
7656
Année:
2010
Langue:
english
DOI:
10.1117/12.864049
Fichier:
PDF, 242 KB
english, 2010
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