Combining moiré patterns and high resolution transmission electron microscopy for in-plane thin films thickness determination
M. Valamanesh, C. Langlois, D. Alloyeau, E. Lacaze, C. RicolleauVolume:
111
Année:
2011
Langue:
english
Pages:
6
DOI:
10.1016/j.ultramic.2010.10.017
Fichier:
PDF, 915 KB
english, 2011