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Capacitance–voltage characterization of silicon oxide and silicon nitride coatings as passivation layers for crystalline silicon solar cells and investigation of their stability against x-radiation
Jan Martin Kopfer, Sinje Keipert-Colberg, Dietmar BorchertVolume:
519
Année:
2011
Langue:
english
Pages:
5
DOI:
10.1016/j.tsf.2011.04.107
Fichier:
PDF, 769 KB
english, 2011