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NanoScan SMPS – A Novel, Portable Nanoparticle Sizing and Counting Instrument
Tritscher, Torsten, Beeston, Michael, Zerrath, Axel F, Elzey, Sherrie, Krinke, Thomas J, Filimundi, Eric, Bischof, Oliver FVolume:
429
Langue:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/429/1/012061
Date:
April, 2013
Fichier:
PDF, 2.12 MB
english, 2013