
Correlating Raman-spectroscopy and high-resolution transmission-electron-microscopy studies of amorphous/nanocrystalline multilayered silicon thin films
Andreja Gajović, Davor Gracin, Krunoslav Juraić, Jordi Sancho-Parramon, Miran ČehVolume:
517
Année:
2009
Langue:
english
Pages:
6
DOI:
10.1016/j.tsf.2009.01.086
Fichier:
PDF, 973 KB
english, 2009