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Photoelectrical measurements of the local value of the contact potential difference in the metal–insulator semiconductor (MIS) structures
A. Kudla, H.M. Przewlocki, L. Borowicz, D. Brzezinska, W. RzodkiewiczVolume:
450
Année:
2004
Langue:
english
Pages:
4
DOI:
10.1016/j.tsf.2003.10.147
Fichier:
PDF, 191 KB
english, 2004