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Impedance spectroscopy studies of moisture uptake in low-k dielectrics and its relation to reliability
Raja, Archana, Laibowitz, Robert, Liniger, Eric G., Shaw, Thomas M., Heinz, Tony F.Volume:
147
Langue:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2015.04.020
Date:
November, 2015
Fichier:
PDF, 1.01 MB
english, 2015