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Addressing Memory and Speed Problems in Nondestructive Defect Characterization: Element-by-Element Processing on a GPU
Sivasuthan, S., Karthik, V. U., Rahunanthan, A., Jayakumar, P., Thyagarajan, R. S., Udpa, Lalita, Hoole, S. R. H.Volume:
34
Langue:
english
Journal:
Journal of Nondestructive Evaluation
DOI:
10.1007/s10921-015-0282-z
Date:
June, 2015
Fichier:
PDF, 980 KB
english, 2015