Dependence of the Electronic Properties of Hot-Wire CVD Amorphous Silicon-Germanium Alloys on Oxygen Impurity Levels
Datta, Shouvik, Cohen, J. David, Xu, Yueqin, Mahan, A. H., Branz, Howard M.Volume:
989
Langue:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-0989-A04-03
Date:
January, 2007
Fichier:
PDF, 185 KB
english, 2007