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Theoretical and experimental comparison of contactless lifetime measurement methods for thick silicon samples
N. Schüler, T. Hahn, K. Dornich, J.R. Niklas, Bianca Gründig-WendrockVolume:
94
Année:
2010
Langue:
english
Pages:
5
DOI:
10.1016/j.solmat.2010.02.028
Fichier:
PDF, 786 KB
english, 2010