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Impact of Surface Morphology on the Electrical Properties of Al/Ti Ohmic Contacts on Al-Implanted 4H-SiC
Frazzetto, Alessia, Roccaforte, Fabrizio, Giannazzo, Filippo, Lo Nigro, Raffaella, Bongiorno, Corrado, Di Franco, Salvatore, Weng, Ming Hung, Saggio, Mario, Zanetti, Edoardo, Raineri, VitoVolume:
679-680
Langue:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.679-680.413
Date:
March, 2011
Fichier:
PDF, 1.47 MB
english, 2011