[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - GPGPUs ECC efficiency and efficacy
Oliveira, Daniel A. G., Rech, Paolo, Pilla, Laercio L., Navaux, Philippe O. A., Carro, LuigiAnnée:
2014
Langue:
english
DOI:
10.1109/dft.2014.6962085
Fichier:
PDF, 276 KB
english, 2014