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Copper Diffusion in Nickel Thin Film under Stresses in the Kinetic Regime 'B'
Balandina, N., Bokstein, Boris, Ostrovsky, A.Volume:
156
Année:
1998
Langue:
english
Journal:
Defect and Diffusion Forum
DOI:
10.4028/www.scientific.net/DDF.156.181
Fichier:
PDF, 503 KB
english, 1998