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Depth profile analysis for MgB2 thin films, formed by B implantation in Mg ribbons using energetic ion backscatterings
Nianhua Peng, Christopher Jeynes, Russell M. Gwilliam, Karen J. Kirkby, Roger P. WebbVolume:
460-462
Année:
2007
Langue:
english
Pages:
2
DOI:
10.1016/j.physc.2007.04.120
Fichier:
PDF, 121 KB
english, 2007