Possible failure modes in Press-Pack IGBTs
Tinschert, Lukas, Årdal, Atle Rygg, Poller, Tilo, Bohlländer, Marco, Hernes, Magnar, Lutz, JosefVolume:
55
Langue:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.02.019
Date:
May, 2015
Fichier:
PDF, 2.83 MB
english, 2015