Conditional time resolved photoemission for debugging ICs with intermittent faults
Zachariasse, Frank, van Hassel, JanVolume:
48
Langue:
english
Pages:
6
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2008.06.034
Date:
August, 2008
Fichier:
PDF, 1.24 MB
english, 2008