ECS Transactions [ECS 220th ECS Meeting - Boston, MA (October 9 - October 14, 2011)] - Investigation on the Drying Dynamics of Millimetric Water Droplets: Source of Watermarks on Silicon Wafers
Belmiloud, Naser, Tamaddon, Amir-Hossein, Mertens, Paul W., Xu, Xiumei, Struyf, HerbertAnnée:
2011
Langue:
english
DOI:
10.1149/1.3630845
Fichier:
PDF, 1.06 MB
english, 2011
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