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Integration of a high density Ta2O5 MIM capacitor following 3D damascene architecture compatible with copper interconnects
M. Thomas, A. Farcy, N. Gaillard, C. Perrot, M. Gros-Jean, I. Matko, M. Cordeau, W. Saikaly, M. Proust, P. Caubet, E. Deloffre, S. Crémer, S. Bruyère, B. Chenevier, J. TorresVolume:
83
Année:
2006
Langue:
english
Pages:
6
DOI:
10.1016/j.mee.2006.09.027
Fichier:
PDF, 642 KB
english, 2006