An analytical approach for the determination of the lateral trap position in ultra-scaled MOSFETs
Illarionov, Yury Yu., Bina, Markus, Tyaginov, Stanislav E., Grasser, TiborVolume:
53
Langue:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.53.04EC22
Date:
January, 2014
Fichier:
PDF, 691 KB
english, 2014