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PHOTOELASTIC STRESS ANALYSIS IN MULTI-MITRED BENDS UNDER IN-PLANE BENDING
SAWA, YoshiakiVolume:
4
Langue:
english
Journal:
Nondestructive Testing Communications
DOI:
10.1080/02780898808962133
Date:
January, 1988
Fichier:
PDF, 312 KB
english, 1988