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Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)
Newbury, Dale E., Ritchie, Nicholas W. M.Volume:
50
Langue:
english
Journal:
Journal of Materials Science
DOI:
10.1007/s10853-014-8685-2
Date:
January, 2015
Fichier:
PDF, 7.81 MB
english, 2015