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[IEEE 2004 Conference on Computer Vision and Pattern Recognition Workshop - Washington, DC, USA (27-02 June 2004)] 2004 Conference on Computer Vision and Pattern Recognition Workshop - Exploiting Depth Discontinuities for Vision-Based Fingerspelling Recognition
Feris, R., Turk, M., Raskar, R., Karhan Tan,, Ohashi, G.Année:
2004
Langue:
english
DOI:
10.1109/cvpr.2004.336
Fichier:
PDF, 475 KB
english, 2004