Model construction and parameter effect for TFT-LCD process based on yield analysis by using ANNs and stepwise regression
Kun-Lin Hsieh, Yen-Sheng LuVolume:
34
Année:
2008
Langue:
english
Pages:
8
DOI:
10.1016/j.eswa.2006.10.014
Fichier:
PDF, 210 KB
english, 2008