[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Analog to digital converters for high temperature applications: The modeling approach issue
Baccar, Sahbi, Qaisar, Saeed Mian, Dallet, Dominique, Levi, Timothee, Shitikov, Vladimir, Barbara, FrancoisAnnée:
2010
Langue:
english
DOI:
10.1109/imtc.2010.5488109
Fichier:
PDF, 706 KB
english, 2010