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[IEEE 2006 International Conference on Electronic Materials and Packaging - Kowloon, China (2006.12.11-2006.12.14)] 2006 International Conference on Electronic Materials and Packaging - Prediction of Process Induced Warpage of Electronic Package by P-V-T-C Equation and Taguchi Method
Chen, Jian-Yu, Teng, Shiang-Yu, Hwang, Sheng-Jye, Lee, Huei-Huang, Huang, Durn-YuanAnnée:
2006
Langue:
english
DOI:
10.1109/emap.2006.4430640
Fichier:
PDF, 1.51 MB
english, 2006