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Characterization of PT thin films deposited by DC sputtering at different temperatures on Ti/glass and TiO 2 /Si substrates
Cruz, Ma de la Paz, Siqueiros, Jesús M., Valenzuela, Jose, Machorro, Roberto, Portelles, Jorge J., Fundora, AbelVolume:
225
Langue:
english
Journal:
Ferroelectrics
DOI:
10.1080/00150199908009141
Date:
March, 1999
Fichier:
PDF, 626 KB
english, 1999