
[IEEE 2014 IEEE 6th International Memory Workshop (IMW) - Taipei, Taiwan (2014.5.18-2014.5.21)] 2014 IEEE 6th International Memory Workshop (IMW) - Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applications
Son, Yunik, Noh, Kyung Bong, Aoulaiche, Marc, Ritzenthaler, Romain, Schram, Tom, Spessot, Alessio, Fazan, Pierre, Cho, Moonju, Franco, Jacopo, Horiguchi, Naoto, Thean, AaronAnnée:
2014
Langue:
english
DOI:
10.1109/imw.2014.6849377
Fichier:
PDF, 925 KB
english, 2014