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[IEEE 2013 IEEE 13th International Conference on Data Mining Workshops (ICDMW) - TX, USA (2013.12.7-2013.12.10)] 2013 IEEE 13th International Conference on Data Mining Workshops - On Using SIFT Descriptors for Image Parameter Evaluation
McInerney, Patrick M., Banda, Juan M., Angryk, Rafal A.Année:
2013
Langue:
english
DOI:
10.1109/icdmw.2013.123
Fichier:
PDF, 897 KB
english, 2013