Quantitative characterization of defect size in graphene using Raman spectroscopy
Pollard, Andrew J., Brennan, Barry, Stec, Helena, Tyler, Bonnie J., Seah, Martin P., Gilmore, Ian S., Roy, DebdulalVolume:
105
Langue:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4905128
Date:
December, 2014
Fichier:
PDF, 869 KB
english, 2014