[IEEE 2014 IEEE Custom Integrated Circuits Conference - CICC 2014 - San Jose, CA, USA (2014.9.15-2014.9.17)] Proceedings of the IEEE 2014 Custom Integrated Circuits Conference - Independent N and P process monitors for body bias based process corner correction
Clark, Lawrence T., Kidd, David, Agrawal, Vineet, Leshner, Sam, Krishnan, GokulAnnée:
2014
Langue:
english
DOI:
10.1109/cicc.2014.6946092
Fichier:
PDF, 984 KB
english, 2014