[IEEE 2007 International Semiconductor Device Research Symposium - College Park, MD, USA (2007.12.12-2007.12.14)] 2007 International Semiconductor Device Research Symposium - Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors
Jurchescu, Oana D., Hamadani, Behrang H., Hao Xiong,, Park, Sungkyu K., Subramanian, Sankar, Zimmerman, Neil M., Anthony, John, Jackson, Thomas N., Gundlach, David J.Année:
2007
Langue:
english
DOI:
10.1109/isdrs.2007.4422500
Fichier:
PDF, 154 KB
english, 2007
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