[IEEE 2012 24th International Conference on Microelectronics (ICM) - Algiers, Algeria (2012.12.16-2012.12.20)] 2012 24th International Conference on Microelectronics (ICM) - TSV impact on circuit performance and recommended design methodologies
Salah, Khaled, El Rouby, Alaa, Ragai, Hani, Ismail, YeheaAnnée:
2012
Langue:
english
DOI:
10.1109/icm.2012.6471405
Fichier:
PDF, 1.38 MB
english, 2012