[IEEE Second International Conference on the Quantitative Evaluation of Systems (QEST'05) - Torino, Italy (2005.09.19-2005.09.22)] Second International Conference on the Quantitative Evaluation of Systems (QEST'05) - X-ray: a tool for automatic measurement of hardware parameters
Yotov, K., Pingali, K., Stodghill, P.Année:
2005
Langue:
english
DOI:
10.1109/qest.2005.44
Fichier:
PDF, 346 KB
english, 2005