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[IEEE 2010 IEEE 3rd International Nanoelectronics Conference (INEC) - Hong Kong, China (2010.01.3-2010.01.8)] 2010 3rd International Nanoelectronics Conference (INEC) - High purity separation of nanoparticle dimers and trimers for SERS hot spots
Chen, Gang, Wang, Yong, Yang, Miaoxin, Tan, Li Huey, Chen, HongyuAnnée:
2010
Langue:
english
DOI:
10.1109/inec.2010.5424723
Fichier:
PDF, 285 KB
english, 2010