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Characterization of thin amorphous silicon films with multiple internal reflectance spectroscopy
Fameli, Giuseppe, della Sala, Dario, Roca, Francesco, Pascarella, Francesco, Grillo, PietroVolume:
78
Année:
1995
Langue:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.360374
Fichier:
PDF, 1.19 MB
english, 1995