[IEEE 2013 8th International Forum on Strategic Technology (IFOST) - Ulaanbaatar, Mongolia (2013.06.28-2013.07.1)] Ifost - The reason to consider the electromagnetic compatibility for a relay protection of microprocessor
Bat-Erdene, Bayar, Battulga, MunkhbaatarAnnée:
2013
Langue:
english
DOI:
10.1109/ifost.2013.6616931
Fichier:
PDF, 134 KB
english, 2013