[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Granular electron injection and random telegraph noise impact on the programming accuracy of NOR Flash memories
Compagnoni, Christian Monzio, Chiavarone, Luca, Calabrese, Marcello, Gusmeroli, Riccardo, Ghidotti, Michele, Lacaita, Andrea L., Spinelli, Alessandro. S., Visconti, AngeloAnnée:
2009
Langue:
english
DOI:
10.1109/irps.2009.5173263
Fichier:
PDF, 210 KB
english, 2009