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[IEEE 2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Victoria, BC, Canada (15-18 Oct. 2000)] 2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.00CH37132) - Behaviour of the metal-oxide-fluid-interface
Julliard, Y., Kist, K., Badent, R., Schwab, A.J.Volume:
2
Année:
2000
Langue:
english
DOI:
10.1109/ceidp.2000.884074
Fichier:
PDF, 401 KB
english, 2000