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[IEEE 2013 Joint IEEE Int'l Symp on Applications of Ferroelectrics & Workshop on Piezoresponse Force Microscopy (ISAF/PFM) - Prague 4, Czech Republic (2013.07.21-2013.07.25)] 2013 Joint IEEE International Symposium on Applications of Ferroelectric and Workshop on Piezoresponse Force Microscopy (ISAF/PFM) - Precise determination of piezoelectric longitudinal charge coefficients for piezoelectric thin films assisted by finite element modeling
Stoeckel, Chris, Kaufmann, Christian, Schulze, Robert, Billep, Detlef, Gessner, ThomasAnnée:
2013
Langue:
english
DOI:
10.1109/isaf.2013.6748725
Fichier:
PDF, 3.47 MB
english, 2013