
[IEEE 29th IEEE Conference on Decision and Control - Honolulu, HI, USA ()] 29th IEEE Conference on Decision and Control - What is a 'large' number of parameters in robust systems?
Ackermann, J., Sienel, W.Année:
1990
Langue:
english
DOI:
10.1109/cdc.1990.203453
Fichier:
PDF, 264 KB
english, 1990